IEEE Design & Test
期刊ISSN: 2168-2356
E-ISSN: -
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自引率: 1.9%
SCI期刊JCR分区
SCI期刊JCR分区等级:3区
按学科分区
ENGINEERING, ELECTRICAL & ELECTRONIC
Q3
COMPUTER SCIENCE, HARDWARE & ARCHITECTURE
Q3
最新中科院SCI期刊分区(基础版)
大类学科
工程技术
4区
小类学科
计算机:硬件
4区
工程:电子与电气
4区
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最新中科院SCI期刊分区(升级版)
大类学科
工程技术
3区
小类学科
计算机:硬件
4区
工程:电子与电气
4区
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期刊简介
IEEE Design & Test offers original works describing the models, methods, and tools used to design and test microelectronic systems from devices and circuits to complete systems-on-chip and embedded software. The magazine focuses on current and near-future practice, and includes tutorials, how-to articles, and real-world case studies. The magazine seeks to bring to its readers not only important technology advances but also technology leaders, their perspectives through its columns, interviews, and roundtable discussions. Topics include semiconductor IC design, semiconductor intellectual property blocks, design, verification and test technology, design for manufacturing and yield, embedded software and systems, low-power and energy-efficient design, electronic design automation tools, practical technology, and standards.
出版信息
出版商
IEEE Computer Society
涉及的研究方向
COMPUTER SCIENCE, HARDWARE & ARCHITECTURE-ENGINEERING, ELECTRICAL & ELECTRONIC
年文章数
61
出版国家或地区
UNITED STATES
是否OA
Cite Score相关
Cite Score SJR SNIP 排名
3.3 0.597 0.962
学科
大类学科:Engineering
小类学科:Electrical and Electronic Engineering
分区
Q2
学科
大类学科:Engineering
小类学科:Hardware and Architecture
分区
Q3
学科
大类学科:Engineering
小类学科:Software
分区
Q3
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