JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS
期刊ISSN: 0923-8174
E-ISSN: 1573-0727
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自引率: 18.2%
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ENGINEERING, ELECTRICAL & ELECTRONIC
Q4
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大类学科
工程技术
4区
小类学科
工程:电子与电气
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最新中科院SCI期刊分区(升级版)
大类学科
工程技术
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小类学科
工程:电子与电气
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期刊简介
The Journal of Electronic Testing: Theory and Applications is an international forum for the dissemination of research and application information in the area of electronic testing. This is the only journal devoted specifically to electronic testing. The papers for publication in Journal of Electronic Testing: Theory and Applications are selected through a peer review to ensure originality, timeliness, and relevance. The journal provides archival material, and through its quick publication cycle, strives to bring recent results to researchers and practitioners. While it emphasizes publication of preciously unpublished material, conference papers of exceptional merit that require wider exposure are, at the discretion of the editors, also published provided they meet the journal's peer review standard. Journal of Electronic Testing: Theory and Applications also seeks clearly written survey and review articles to promote improved understanding of the state of the art.
出版信息
出版商
Springer US
涉及的研究方向
工程技术-工程:电子与电气
刊期
Bimonthly
年文章数
47
出版国家或地区
UNITED STATES
是否OA
Cite Score相关
Cite Score SJR SNIP 排名
1.8 0.325 0.585
学科
大类学科:Engineering
小类学科:Electrical and Electronic Engineering
分区
Q3
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